AUC Problem Solving with UltraScan

Introduction to UltraScan and UltraScan Data Analysis

Presenter: Borries Demeler, University of Texas, USA

Description for morning session (Introduction to UltraScan):

In the morning session, I will present an easy introduction into UltraScan, discuss the basic concepts underlying data analysis with UltraScan and help participants become familiar using a database backend for data management. I will go over the LIMS system and remote supercomputer analysis, and discuss the layout of UltraScan modules and data files, and review the data workflow when performing data analysis. Participants will learn how to commit data, perform the basic workflows for data processing, and use the supercomputer backend, utilize the reporting system, and manipulate data both locally and in the database. Participants will learn how to upload and edit absorbance, intensity, fluorescence and interference data, and how to retrieve data from the new Optima AUC. We will review the data manager and other utilities to help you access your data remotely from different computers and resume analysis from different sites.

Description for afternoon session (UltraScan Data Analysis):

During the afternoon session, I will focus on advanced topics in experimental design, data analysis and result interpretation. We will review the information obtained from various analysis methods and compare and contrast what can be learned from each method (and what cannot be learned!). We will discuss the 2-dimensional spectrum analysis, custom grid method, genetic algorithms, the parametrically constrained spectrum analysis, the Monte Carlo analysis, the van Holde - Weischet analysis and discrete model genetic algorithms for fitting interacting systems and custom-built models.

I will also review strategies for maximizing experimental information by judiciously designing your experiments, and discuss caveats, tips and tricks that are often overlooked. This will be done by example using sample data from systems that illustrate the following concepts:

Another part of this workshop will look at visualizations for finite element models using 2-dimensional and 3-dimensional plotting procedures, and if time permits, I'll present advanced topics in multi-wavelength analysis and cover how publication-quality custom graphs can be generated with UltraScan.

This workshop will be presented in two sessions: Introduction to UltraScan, Monday morning from 9:00-13:30, time slots 3 + 4, and UltraScan Data Analysis, Monday afternoon from 14:30-19:00, time slots 5 + 6. The workshop will be repeated all day Tuesday during time slots 7 + 8, and 9 + 10.

Please note:

  1. The morning sessions are prerequisite for participation in the afternoon sessions unless prior arrangements have been made with the workshop presenter.
  2. Workshop participants must bring a wifi capable laptop with the latest version of UltraScan installed on it, and registered a LIMS account in the UltraScan Demo LIMS instance. To sign up, please visit this link.